Non-Destructive Characterization of AM Surfaces and Issues surrounding characterizing AM surfaces

This course discussed the fundamentals of Crystallography and X-ray diffraction (XRD) of metals, ceramics and polymers. It introduced the main issues and techniques of diffraction analysis as they relate to materials. The techniques for the experimental phase identification and determination of phase fraction via XRD was reviewed. Topics covered include: basic X-ray physics, basic crystallography, fundamentals of XRD, XRD instrumentation and analysis techniques.